μετρητικό σύστημα

Leica EM TXP

The EM TXP is a unique device developed for the precise preparation of a wide range of materials and material compositions with the smallest local defects. It is specially designed for sawing, milling, grinding, and polishing demanding, small, and unwieldy samples, where the work process is observed using a stereo microscope, and final examination under the scanning electron microscope or light microscope can be carried out without interrupting the individual work steps.

The EM TXP also offers an excellent solution for the pre-preparation of materials intended for slope cuts using an ion polishing system.

Including the following accessories:

1 piece Stereo microscope M80, complete
1 piece Crosshair plate for M80, 12 mm
1 piece Movable objective adapter for M80
1 piece Angle adjustment adapter
1 piece Diamond saw blade
1 piece Diamond saw blade
1 piece Special milling cutter with 6 mm Ø diamond tip
1 piece Special milling cutter with 12 mm Ø diamond tip
1 piece Special milling cutter with 8 mm Ø WC cutter
1 piece Special milling cutter with 12 mm Ø WC cutter
5 pieces Mandrel
3 pieces Carrier for lapping film
1 piece Lapping film 15µm, SiC, Ø 30 mm
1 piece Lapping film 9µm, SiC, Ø 30 mm
1 piece Lapping film 5µm, SiC, Ø 30 mm
3 pieces Carrier for lapping film
1 piece Lapping film 9µm, diamond (Type U)
1 piece Lapping film 2µm, diamond (Type U)
1 piece Lapping film 0.5µm, diamond (Type U)
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1 piece Lapping film 0.1µm, diamond (Type LA)
3 pieces Carrier for lapping film
1 piece Lapping film 9µm, aluminum oxide
1 piece Lapping film 3µm, aluminum oxide
1 piece Lapping film 1µm, aluminum oxide
1 piece Lapping film 0.3µm, aluminum oxide
1 piece Neoprene cloth for final polishing (8 units)
2 pieces Storage box for carriers and films
1 piece Holder for flat samples 0–4 mm
1 piece Flat specimen holder 3–8 mm
1 piece TXP SEM stub holder
1 piece Universal sample holder

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